Features
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The PHASE II PTG-3200
can perform two different methods of calculating
thickness measurement by utilizing the characteristics
of both eddy current and magnetic induction.
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Testing performance is
both non-destructive and extremely accurate.
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With this state of the
art thickness gage, you can easily detect the thickness
of nonmagnetic coating on a magnetic substrate (ferrous)
or an insulating coating on a non-magnetic conductive
substrate (non-ferrous) with only a simple change of the
probe.
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The PHASE II PTG-3200
can be used in many areas of industry including
manufacturing, general engineering, commercial
inspection, etc
Included Accessories
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SPECIFICATIONS |
Measuring range |
0-2000 µ m max. or 0-80 mils |
Resolution |
0.1µ m / 0.01mils(0-99µ m) or 1µ
m (over 100µ m) |
Guaranteed tolerance:
After one-point
calibration |
+/- 1-3%n or 2µ m (whichever is greater)
|
Display |
4 digits (digit height =
10mm/0.4") |
Min. measuring area |
0.2" x 0.2" (5mm x 5mm) |
Min. radius of curvature |
Convex: 0.12" (3mm)
Concave: 1.2" (30mm) |
Min. substrate thickness |
Ferrous: 20 mils (0.5mm)
Non-ferrous: 2 mils (50 µ m) |
Calibration |
Zero Calibration
Foil calibration |
Surface temperature of test object |
302 degrees F
(contact time max is 2 seconds) |
Power source |
4 AA batteries |
Dimensions |
161 x 69 x 32mm |
Weight |
9oz. (260g) |
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There are no further details.
There are no further specifications.
There is no further information.
There are no listed accessories.